Product Announcement:
Model 505A & 506 Automated Optical Inspection Product Family

MCKINNEY, TEXAS -- Testronics is proud to announce the Model 505A and 506 Automated Optical Inspection product family.  

Model 505A
Advanced AOI System

Model 506
Backplane AOI System

Breakthrough Features & Capabilities:

  • Interactive / Dynamic Inspection with external I/O control
  • Visual Basic Programming Language added
  • Multiple cameras
  • Multiple lighting options
  • Bar code read and decode through the camera
  • Algorithms now accept Hugh, Saturation, and Luminance parameters
  • Graphical utility to quickly create new library parts
  • Localized fiducials supports fine pitch and panelized multiple images
  • Optional product covers and interlocks
  • Panelization utility with individual image rotation
  • Support for panelization X-OUTS during runtime
Features Benefits
Dynamic inspection capability with I/O control

The Testronics Model 505 / 506 Benchtop AOI systems now have interactive Input / Output capability to actively control the board under inspection with the addition of Opto22 style I/O control. This new capability allows the user to do such things as power up and change the state of the assembly. A few application examples would be:

  • Turning on LED’s to check the correct color was installed
  • Turning on lights and checking for brightness
  • Turning on displays and verifying the image changes or segments are correct
  • Verifying that a mechanical operation occurred
  • Additionally, the system can monitor input bits thereby allowing the assembly, [or some other external device] control of the inspection process.
  • The 24 channel I/O module mounts to the rear of the 505 or 506 and is compatible with existing systems.
Visual Basic Test program language

A Scripting Language, [a subset of Visual Basic] has been integrated to allow the user full control of the system and the inspection sequence. Examples where the scripting language would be used: 

  • Conditional testing
  • Automatic program load based on bar code read
  • Branching to different tests based on prior inspection results
  • Linking several inspection programs together 
  • I/O control of the UUT throughout the inspection sequence
  • Executing National Instruments style digital I/O cards
  • Communication to factory information systems
Support for up to 4 cameras

Multiple cameras provide different fields of view and different focal lengths. A few applications would be:

  • Different focal lengths, thereby allowing very tall components and very short components to be inspected without any loss in resolution or focus.
  • Different fields of view thereby providing the ability to inspect very small components by increasing the magnification or very large components by decreasing the magnification
Multiple lighting options

Options are available for low angle lighting as well as coaxial (high angle) lighting.

  • High angle (coaxial) for inspecting holes
  • Low angle for illuminating the laser etching of IC's
  • Very low angle for illuminating the tips of connector pins
Bar Code reading directly through the camera

Bar Code reading through the camera is now a standard feature. Supports the most popular encoding, including the very small 2d matrix codes. The bar code information is contained in a variable and is fully accessible by the program developer.

Inspections algorithms now accept values for Hue, Saturation, and Luminance

Inspection algorithms now accept Hue, Saturation, & Luminance, [HSL] parameters as well as the original Red Green & Blue color channel parameters. The addition of HSL parameters provide the ability to inspect components for correct color or shading.

Graphical utility to quickly create new parts for the library

A new graphical software tool to quickly and easily create Library Components is included as a standard feature. This graphical tool places a semi-transparent window over the component so that the user can create, [or assign], a new component in a matter of seconds. Assignment of (or changing) the library item to all other similar components is accomplished globally with just one click.

Localized fiducials

The ability to run multiple images with localized fiducials is now possible. This capability enables very fine pitch devices to be inspected on very large boards or panels. Each fine pitch component or panel image can have its own set of fiducials thereby adding a high degree of precision to the inspection.

Optional product covers & interlocks

An optional Product Cover with Emergency Power Off and Lock Out Switches is now available. Even though the stage on the system has a very low torque, some facilities do not allow any moving parts to be accessible to an operator. The product cover option allows the system meet the strictest of standards.

Optional product covers & interlocks

An optional Product Cover with Emergency Power Off and Lock Out Switches is now available. Even though the stage on the system has a very low torque, some facilities do not allow any moving parts to be accessible to an operator. The product cover option allows the system meet the strictest of standards.

Panelization utility supports individual board placement and rotation

Developing an inspection program for a panelized assembly is easy with any system if the individual images are equally spaced and are oriented in the same direction. However, this is typically not "real world". Individual images can be rotated across the panel as well as unevenly spaced from image to image. The Testronics panelization utility provides a quick and easy way to create an inspection program for the most complex panels.

Dynamic graphical representation of the panel and the individual images (change the layout or number of images and the graphical representation changes)

Each image can be rotated individually

Each image can be adjusted individually

System software supports X-OUT capability when running panels

With the X-out button selected, the operator can specify which image the system is to skip over and not inspect. This keeps the operator from having to sift through possibly hundreds of failures.

Requst more information.

© 2006 Testronics. All rights reserved worldwide. | Information provided is subject to change without notice.