Frequently Asked Questions (FAQs)

Model 406

IC test: Please explain how you test IC’s. Will you check all pins of the IC or only a few unique pins?  What about BGA’s?

Analog IC Verification - Each lead on every IC is automatically characterized with respect to itself and all other pins within that same IC. Two measurements are made on each IC pin providing a unique signature thereby enabling detection of SMD lifted pad faults as well as missing, reversed, or wrong IC faults. The two measurements that are made are: Vf (forward voltage drop) at 1mA and Vf at 5mA. These are compared to the stored Vf and delta Vf of each pin. These levels are fully programmable. This IC characterization method is the fastest, easiest to use and least costly of all vectorless techniques. Furthermore, the Testronics IC Verification is the only method suitable for BGA’s short of Boundary Scan. The only circumstance where this technique will not work is only on pins that are bussed together, (such as in a SIMM ram module).

How do you test bused IC pins? What type of defects can you detect in this case?

The most efficient way to test bussed pins on an IC’s is with Agilent’s (HP’s) Test Jet. Keep in mind that the Testronics Analog IC verification technique will find open solder joints on all IC’s and BGA’s that are not bussed. Therefore, Test Jet is only needed on a very few of the IC’s pins. Please note that TestJet is not all that effective on BGA’s. To test BGA connectivity the Testronics IC Verification should be used.

Can the test program support multiple variants [board options] or panelization of one board?

Yes, by inserting branching and conditional variables into the program, the operator can be prompted as to which variant he wants to test and that portion of the program will be run. Panelized boards are programmed by debugging the first board and then running a macro to automatically expand the program for the rest of the boards in the panel. Testronics Operating System (TOS) provides automated test program generation with intuitive software tools and input screens for programming ease.

Does the 406 provide for expansion into functional testing?

Yes, the 406 Analog In-Circuit test system is designed with a scaleable, open architecture and modular plug and play system cards. The system provides the user with almost unlimited flexibility by using a VME style bus designed specifically for in-circuit test. A Testronics instrument card combined with IEEE instruments can create functional level tests. The IEEE functional signals can be sent bi-directionally to any point on the test system matrix. For example, one of our customers runs the standard MDA test, powers up the board with a programmable HP PS, digitally tests a display driver with National Instruments computer digital I/O cards, and also runs an interactive light and button test. This has allowed them to combine their functional test with their ICT test, reducing equipment costs, labor costs, and handling time. 

Does the software provide the ability to give control to another executable program and return to the Testronics test program?

Yes, TOS provides an action or function called “exec” which when inserted into your test program, relinquishes program control to an executable file developed from a language of your choice and then returns to test program.

© 2006 Testronics. All rights reserved worldwide. | Site Map
Information provided is subject to change without notice.