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BackPlane Test Systems
Model 401
Model 402

AOI Systems
Model 506

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Model 401
High Pin Count Level IV
Backplane Test System

Description here.

Model 402
Very High Pin Count Level IV
Backplane Test System

Description here.

Model 504
Benchtop AOI System

The model 504 was developed specifically to provide higher throughput but at a much lower price.

Model 506
Backplane AOI System

The Model 506 was developed to provide a high coverage, easy-to-program AOI system for the larger backplanes / backpanels being produced today.

Model 505A
Advanced AOI System

Description here.

Model 406A
Low Cost Manufacturing Defects Analyzer

The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs.

Model 406C
Analog In-Circuit Test System

The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed.