Top Side Probing is added to Testronics Model 402LV Backplane Test Systems

In the past, the quantity of top side test points represented a small percentage of the overall backplane’s test point count. However, today’s larger, denser backplanes utilize many more top side test points than ever before. Therefore we have introduced a Top Side Access grid option to the model 402LV, our latest generation backplane test system. By using a Top Side Access grid, the need for fixture top side transfer pins is eliminated, thereby reducing the price of complex fixtures by 10% - 20%.

A Top Side Access grid is nothing new to Testronics as our first high pin count test system was built in 1985 and had 49k test points. The model 402LV’s hardware and software architecture provides for a total of 65,536 test points, (each with 6 wire guarding, 4 wire Kelvin, and analog ICT). The switch matrix pin cards plug directly onto the back of the top side spring probes, thereby eliminating any cables for superior reliability and measurement performance & accuracy.

The 402LV's press still retracts, thereby keeping Testronics' proven design of 16 years which comes from the experience gained by having tested millions of backplanes on our systems. (By retracting the press, different fixtures are easily changed out plus grid maintenance & repair can be accomplished in seconds due to the open access.) 

If you currently have a Testronics model 401, you can still use your existing fixtures and test programs as the 402 is 100% compatible. No adapters are needed. (Adapters are very expensive and add an extra spring probe contact per test point, thereby increasing the chances for intermittent probe contact & unrepeatable test.)

 

Typical System Configurations:

Even though the 402LV can be configured to any test point count, (up to 65,536 points) here are a few of the typical configurations:

• 20k points bottom grid
• 31k points bottom grid
• 41k points bottom grid
• 20k points bottom grid 12k points top side grid
• 31k points bottom grid 12k points top side grid
• 31k points bottom grid 24k points top side grid
• 41k points bottom grid 24k points top side grid

Also, if in the future your test requirements change, you can easily increase the test point count of the 402LV on-site. No long down time, no shipping the system back. We will send a technician to your facility along with the upgrade kit and within just a short amount of time you will be back in production but with a larger test point capability.

 

User Defined Grid Areas:

There are also three user grid areas available on the top side. The user defined grids can be used for a variety of applications such as:

• Applying power to the backplane
• Introducing functional test signals
• Performing external measurements
• Programming EEPROMs / applying boundary scan signals
• Applying RF signals & performing high frequency measurements
• Controlling motors inside the fixture for mating connector testing
• Etc., (user defined

 

Model 401 (End of Life) to Model 402 Trade-in / Upgrade

Do you have a model 401 backplane test system? Testronics is offering a Trade-In / Upgrade program that will provide the opportunity to recoup 40% - 50% of the price of the original 401. Here is a link for additional information: http://www.testronics.com/401_402_Upgrade.php

401 to 402 Upgrade

 

 

Top Side Access Product Note in PDF format: http://www.testronics.com/pdf_files/top_side_probe_a.pdf

 

Please feel free to visit the Model 402’s page on our web site for additional information or just send us an e-mail directly at info@testronics.com. We look forward to hearing from you and discussing your application further.